No |
Authors |
Title |
Journal |
1 |
WJ Tunstall & P J Goodhew |
Electron microscope image contrast of double
loops in quenched aluminium |
Phil Mag 13, 1259-1272 (1966) |
2 |
PJ Goodhew |
Preparation of carbon fibres for transmission
electron microscopy |
J Phys E 4, 392-394 (1971) |
3 |
PJ Goodhew |
Low angle electron scattering from carbonized
polymer fibres |
Nature 235, 437-438 (1972) |
4 |
PJ Goodhew |
Low angle diffraction from fibres |
J Phys D 1596- 1603 (1972) |
5 |
PJ Goodhew |
The interpretation of low angle electron
diffraction patterns from fibres by optical analogue techniques |
5th Eur Cong on Electron Microscopy 204-205
(1972) |
6 |
PJ Goodhew & MJ Hepburn |
Ion beam thinning of cylindrical objects |
5th Eur Cong on Electron Microscopy 300-301
(1972) |
7 |
PJ Goodhew |
Optical diffraction from selected areas of
micrographs |
Proc Roy Microsc Soc 9, 94 (1974) |
8 |
PJ Goodhew & JEC Gulley |
The determination of alkali metals in glasses by
electron probe microanalysis |
GlassTechnol 15, 123-126 (1974) |
9 |
PJ Goodhew & MJ Hepburn |
Current monitoring for an ion beam thinning
apparatus |
J Phys E 8, 86-88 (1975) |
10 |
PJ Goodhew |
Electron probe microanalysis of glasses
containing alkali metals |
Microstructural Science 3, 631-641 (1975) |
11 |
D Aitken, SK Tyler & PJ Goodhew |
A technique for the preparation of thin foils
from regions near to a metal surface |
J Phys E 11, 511-513 (1978) |
12 |
MI Manning & PJ Goodhew |
An hydraulic straining stage for use in scanning
electron microscopes |
J Phys E 12, 464-466 (1979) |
13 |
PJ Goodhew & D Chescoe |
Microanalysis in the transmission electron
microscope |
Micron 11, 153-181 (1980) |
14 |
D Chescoe & PJ Goodhew |
Optimization of instrumental conditions for TEM
analysis of hydrated cement |
Proc Conf 'Microanalysis with high spatial
resolution' Manchester 1981, 119-124 |
15 |
PJ Goodhew & D Chescoe |
Contrast from amorphous hollow fibres |
Proc EMAG 81 Inst of Physics (1981) 351-354 |
16 |
R J Cox and P J Goodhew |
The determination of gas pressures in argon
bubbles by analytical electron microscopy |
Proc 8th Eur Cong EM Budapest 1984 |
17 |
PJ Goodhew, PM Budd and D Chescoe |
Some comparisons between ELS and windowless
EDS |
Proc AEM workshop, LeHigh 1984 |
18 |
P J Goodhew |
Light element analysis in the TEM using
windowless X-ray detectors |
Proc EMAG 85 Inst Phys Conf Ser 78 183-188
(1985) |
19 |
PM Budd & PJ Goodhew |
On-line analysis of diffraction information |
Proc EMAG 85, Inst Phys Conf Ser 78, 55-58
(1985) |
20 |
PM Budd and PJ Goodhew |
The analysis of boron using a windowless X-ray
detector |
Proc XIth Int Cong Electron Microscopy, Kyoto
577-578 (1986) |
21 |
RS Payne, PM Budd and PJ Goodhew |
Quantitative windowless EDX and EELS of an
argon-implanted metallic glass |
Proc XIth Int Cong Electron Microscopy, Kyoto
1563-1564 (1986) |
22 |
PM Budd, PJ Goodhew and SH Vale |
Digital CBED patterns collected by EELS |
'Microbeam Analysis', 1986, Eds A D Romig & W
F Chambers 409-410 (1986) |
23 |
PM Budd and PJ Goodhew |
Boron analysis with a windowless X-ray
detector |
'Microbeam Analysis', 1986, Eds A D Romig & W
F Chambers,449-450 (1986) |
24 |
RJ Cox & PJ Goodhew |
Streaking in diffraction patterns from aluminium
containing argon bubbles |
'Analytical Electron Microscopy', Ed GW Lorimer,
Inst Metals 1988, 77-79 |
25 |
MS Laws and PJ Goodhew |
Alignment of a twin boundary with respect to the
electron beam in TEM |
Inst Phys Conf Ser 93, 2, 411-412 (1988) |
26 |
PJ Goodhew |
Specimen preparation for transmission electron
microscopy of metals |
Mat Res Soc Symp Proc 115, 51-62 (1988) |
27 |
RJ Cox & PJ Goodhew |
A combined TEM and X-ray microanalytical study of
argon in aluminium |
J Nucl Mater 154, 233-244 (1988) |
28 |
PJ Goodhew |
Electron microscopy of semiconductors |
Metals & Materials, Feb 1989 pp82-85 |
29 |
PJ Goodhew & D Chescoe |
Electron Microscopy |
Encyclopedia of Human Biology 3 271-9 (1991) |
30 |
PJ Goodhew |
Quantitative measurements from crystalline
materials in the TEM |
Proc X Europ Congress on Electron Microscopy,
Granada, Eds A Lopez-Galindo & MI Rodriguez-Garcia, Vol 2 (1992)
211-215 |
31 |
PJ Goodhew |
The compleat hyleographer |
Microscopy and Analysis 1993 |
32 |
PJ Goodhew |
Are microscopes too sophisticated? |
Proc RMS 28 201-203 (1993) |
33 |
PJ Goodhew |
Preparation of plan-view and cross-sectional
specimens for TEM |
Proc MSA 1993 |
34 |
G Cliff, RW Devenish, PJ Goodhew, RJ Keyse &
GW Lorimer |
Preliminary results from a new ultra-high
resolution analytical electron microscope |
Proc 13th Int Cong EM, Paris 1994, 1 (1994)
719-720 |
35 |
PJ Goodhew |
Microscopy in the 21st Century |
Laboratory Technology International, Cornhill
(1995) |
36 |
PJ Goodhew |
Microstructural Metrology |
'Materials Metrology and Standards for Structural
Performance', Eds B FDyson, M S Loveday & M G Gee, Chapman &
Hall.(1995) 271-289 |
37 |
PJ Goodhew |
Quantitative Transmission Electron
Microscopy |
Electron Mic Soc of South Africa, Proceedings 25
(1995)1-2 |
38 |
PJ Goodhew |
Quantitative Hyleography |
'Handbook of Microscopy', Eds S Amelinckx, D van
Dyck, J van Landuyt, G van Tendeloo, VCH, Vol 3 Applications:1997:821-833 |
39 |
HJ Davock, AJ Harvey & PJ Goodhew |
The Determination of the Composition of InAs
Quantum Dots in a GaAs matrix using STEM |
IOP Conf Ser 161 (1999) 613-616 |
40 |
A.L Bleloch, L.M.Brown, R.M.Brydson, A.J.Craven,
P.J.Goodhew and C.J.Kiely |
The SuperSTEM; An Aberration Corrected Analytical
Microscopy Facility , |
Microscopy and Microanalysis, (2002), 8(2),
suppl, 470-471. |
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