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Professor Peter J Goodhew

   

Papers on Electron Microscopy

   

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No Authors Title Journal
1 WJ Tunstall & P J Goodhew Electron microscope image contrast of double loops in quenched aluminium Phil Mag 13, 1259-1272 (1966)
2 PJ Goodhew Preparation of carbon fibres for transmission electron microscopy J Phys E 4, 392-394 (1971)
3 PJ Goodhew Low angle electron scattering from carbonized polymer fibres Nature 235, 437-438 (1972)
4 PJ Goodhew Low angle diffraction from fibres J Phys D 1596- 1603 (1972)
5 PJ Goodhew The interpretation of low angle electron diffraction patterns from fibres by optical analogue techniques 5th Eur Cong on Electron Microscopy 204-205 (1972)
6 PJ Goodhew & MJ Hepburn Ion beam thinning of cylindrical objects 5th Eur Cong on Electron Microscopy 300-301 (1972)
7 PJ Goodhew Optical diffraction from selected areas of micrographs Proc Roy Microsc Soc 9, 94 (1974)
8 PJ Goodhew & JEC Gulley The determination of alkali metals in glasses by electron probe microanalysis GlassTechnol 15, 123-126 (1974)
9 PJ Goodhew & MJ Hepburn Current monitoring for an ion beam thinning apparatus J Phys E 8, 86-88 (1975)
10 PJ Goodhew Electron probe microanalysis of glasses containing alkali metals Microstructural Science 3, 631-641 (1975)
11 D Aitken, SK Tyler & PJ Goodhew A technique for the preparation of thin foils from regions near to a metal surface J Phys E 11, 511-513 (1978)
12 MI Manning & PJ Goodhew An hydraulic straining stage for use in scanning electron microscopes J Phys E 12, 464-466 (1979)
13 PJ Goodhew & D Chescoe Microanalysis in the transmission electron microscope Micron 11, 153-181 (1980)
14 D Chescoe & PJ Goodhew Optimization of instrumental conditions for TEM analysis of hydrated cement Proc Conf 'Microanalysis with high spatial resolution' Manchester 1981, 119-124
15 PJ Goodhew & D Chescoe Contrast from amorphous hollow fibres Proc EMAG 81 Inst of Physics (1981) 351-354
16 R J Cox and P J Goodhew The determination of gas pressures in argon bubbles by analytical electron microscopy Proc 8th Eur Cong EM Budapest 1984
17 PJ Goodhew, PM Budd and D Chescoe Some comparisons between ELS and windowless EDS Proc AEM workshop, LeHigh 1984
18 P J Goodhew Light element analysis in the TEM using windowless X-ray detectors Proc EMAG 85 Inst Phys Conf Ser 78 183-188 (1985)
19 PM Budd & PJ Goodhew On-line analysis of diffraction information Proc EMAG 85, Inst Phys Conf Ser 78, 55-58 (1985)
20 PM Budd and PJ Goodhew The analysis of boron using a windowless X-ray detector Proc XIth Int Cong Electron Microscopy, Kyoto 577-578 (1986)
21 RS Payne, PM Budd and PJ Goodhew Quantitative windowless EDX and EELS of an argon-implanted metallic glass Proc XIth Int Cong Electron Microscopy, Kyoto 1563-1564 (1986)
22 PM Budd, PJ Goodhew and SH Vale Digital CBED patterns collected by EELS 'Microbeam Analysis', 1986, Eds A D Romig & W F Chambers 409-410 (1986)
23 PM Budd and PJ Goodhew Boron analysis with a windowless X-ray detector 'Microbeam Analysis', 1986, Eds A D Romig & W F Chambers,449-450 (1986)
24 RJ Cox & PJ Goodhew Streaking in diffraction patterns from aluminium containing argon bubbles 'Analytical Electron Microscopy', Ed GW Lorimer, Inst Metals 1988, 77-79
25 MS Laws and PJ Goodhew Alignment of a twin boundary with respect to the electron beam in TEM Inst Phys Conf Ser 93, 2, 411-412 (1988)
26 PJ Goodhew Specimen preparation for transmission electron microscopy of metals Mat Res Soc Symp Proc 115, 51-62 (1988)
27 RJ Cox & PJ Goodhew A combined TEM and X-ray microanalytical study of argon in aluminium J Nucl Mater 154, 233-244 (1988)
28 PJ Goodhew Electron microscopy of semiconductors Metals & Materials, Feb 1989 pp82-85
29 PJ Goodhew & D Chescoe Electron Microscopy Encyclopedia of Human Biology 3 271-9 (1991)
30 PJ Goodhew Quantitative measurements from crystalline materials in the TEM Proc X Europ Congress on Electron Microscopy, Granada, Eds A Lopez-Galindo & MI Rodriguez-Garcia, Vol 2 (1992) 211-215
31 PJ Goodhew The compleat hyleographer Microscopy and Analysis 1993
32 PJ Goodhew Are microscopes too sophisticated? Proc RMS 28 201-203 (1993)
33 PJ Goodhew Preparation of plan-view and cross-sectional specimens for TEM Proc MSA 1993
34 G Cliff, RW Devenish, PJ Goodhew, RJ Keyse & GW Lorimer Preliminary results from a new ultra-high resolution analytical electron microscope Proc 13th Int Cong EM, Paris 1994, 1 (1994) 719-720
35 PJ Goodhew Microscopy in the 21st Century Laboratory Technology International, Cornhill (1995)
36 PJ Goodhew Microstructural Metrology 'Materials Metrology and Standards for Structural Performance', Eds B FDyson, M S Loveday & M G Gee, Chapman & Hall.(1995) 271-289
37 PJ Goodhew Quantitative Transmission Electron Microscopy Electron Mic Soc of South Africa, Proceedings 25 (1995)1-2
38 PJ Goodhew Quantitative Hyleography 'Handbook of Microscopy', Eds S Amelinckx, D van Dyck, J van Landuyt, G van Tendeloo, VCH, Vol 3 Applications:1997:821-833
39 HJ Davock, AJ Harvey & PJ Goodhew The Determination of the Composition of InAs Quantum Dots in a GaAs matrix using STEM IOP Conf Ser 161 (1999) 613-616
40 A.L Bleloch, L.M.Brown, R.M.Brydson, A.J.Craven, P.J.Goodhew and C.J.Kiely The SuperSTEM; An Aberration Corrected Analytical Microscopy Facility ,  Microscopy and Microanalysis, (2002), 8(2), suppl, 470-471.
       

 Please click below for papers published by Peter on:

Education, Semiconductors, Gas Bubbles, Other miscellaneous papers, Lighthearted Articles and Software

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